Title :
Suppression of transverse-mode spurious responses for zero temperature coefficient of frequency SAW resonator on a SiO2/Al/LiNbO3 structure
Author :
Nakanishi, H. ; Nakamura, H. ; Tsurunari, T. ; Fujiwara, J. ; Hamaoka, Y. ; Hashimoto, K.
Author_Institution :
Corp. Components Dev. Div., Panasonic Electron. Devices Co., Ltd., Kadoma, Japan
Abstract :
This paper describes a suppression of transverse-mode spurious responses for zero temperature coefficient of frequency (TCF) surface acoustic wave (SAW) resonator on a SiO2/Al/LiNbO3 structure. We investigated to use thinning of SiO2 on the dummy electrodes and studied how the transverse-mode responses change with remaining SiO2 thickness h on the dummy electrode region. As the results, we could realize high performance SAW resonator with complete suppression of the transverse-mode spurious responses when h is set at 0.20λ. It was demonstrated that the selective SiO2 removal technique is effective to suppress transverse-mode spurious responses for SAW resonators employing the SiO2/Al/LiNbO3 structure for wide range of SiO2 thicknesses, provided that the SiO2 thickness at the dummy electrode region is adjusted properly.
Keywords :
aluminium; electrodes; lithium compounds; silicon compounds; surface acoustic wave resonators; SAW; SiO2-Al-LiNbO3; dummy electrodes; frequency surface acoustic wave resonator; transverse-mode spurious responses; zero temperature coefficient; Admittance; Electrodes; Films; Lithium niobate; Resonant frequency; Surface acoustic waves; Temperature; SAW resonator; SiO2 selective removal; SiO2/Al/LiNbO3 structure; transverse-mode spurious response;
Conference_Titel :
Ultrasonics Symposium (IUS), 2011 IEEE International
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1253-1
DOI :
10.1109/ULTSYM.2011.0019