• DocumentCode
    3223290
  • Title

    Suppression of transverse-mode spurious responses for zero temperature coefficient of frequency SAW resonator on a SiO2/Al/LiNbO3 structure

  • Author

    Nakanishi, H. ; Nakamura, H. ; Tsurunari, T. ; Fujiwara, J. ; Hamaoka, Y. ; Hashimoto, K.

  • Author_Institution
    Corp. Components Dev. Div., Panasonic Electron. Devices Co., Ltd., Kadoma, Japan
  • fYear
    2011
  • fDate
    18-21 Oct. 2011
  • Firstpage
    72
  • Lastpage
    75
  • Abstract
    This paper describes a suppression of transverse-mode spurious responses for zero temperature coefficient of frequency (TCF) surface acoustic wave (SAW) resonator on a SiO2/Al/LiNbO3 structure. We investigated to use thinning of SiO2 on the dummy electrodes and studied how the transverse-mode responses change with remaining SiO2 thickness h on the dummy electrode region. As the results, we could realize high performance SAW resonator with complete suppression of the transverse-mode spurious responses when h is set at 0.20λ. It was demonstrated that the selective SiO2 removal technique is effective to suppress transverse-mode spurious responses for SAW resonators employing the SiO2/Al/LiNbO3 structure for wide range of SiO2 thicknesses, provided that the SiO2 thickness at the dummy electrode region is adjusted properly.
  • Keywords
    aluminium; electrodes; lithium compounds; silicon compounds; surface acoustic wave resonators; SAW; SiO2-Al-LiNbO3; dummy electrodes; frequency surface acoustic wave resonator; transverse-mode spurious responses; zero temperature coefficient; Admittance; Electrodes; Films; Lithium niobate; Resonant frequency; Surface acoustic waves; Temperature; SAW resonator; SiO2 selective removal; SiO2/Al/LiNbO3 structure; transverse-mode spurious response;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2011 IEEE International
  • Conference_Location
    Orlando, FL
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4577-1253-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2011.0019
  • Filename
    6293055