DocumentCode :
3223714
Title :
Transport and storage wafer carrier cost of ownership
Author :
Mikkelsen, Kirk J.
Author_Institution :
Fluoroware Inc., North Chaska, MN, USA
fYear :
1995
fDate :
13-15 Nov 1995
Firstpage :
45
Lastpage :
49
Abstract :
Transport and storage wafer carriers manufactured from different materials vary greatly in their initial cost. Many fabs have based their transport and storage carrier selection solely on this initial cost. However, total cost or cost of ownership depends on much more than the initial cost. This paper deals with the interrelationship between material properties, such as, particle generation, dimensional stability, outgassing, and temperature and how they affect cost of ownership. For example, particle generation and outgassing affect yield and the frequency of carrier and wafer cleaning steps. Dimensional accuracy and stability has an impact on equipment down time, wafer loss and particle generation. Temperature capabilities affect throughput and number of wafer transfers required. Dimensional stability and outgassing are also dependent on the temperature capabilities (thermal properties) of the transport wafer carrier material.
Keywords :
conveyors; economics; integrated circuit manufacture; integrated circuit yield; surface cleaning; cost of ownership; dimensional stability; outgassing; particle generation; storage wafer carrier; transport wafer carriers; wafer cleaning; wafer loss; wafer transfers; yield; Cleaning; Costs; Frequency; Kirk field collapse effect; Manufacturing; Material storage; Procurement; Stability; Temperature; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1995. ASMC 95 Proceedings. IEEE/SEMI 1995
ISSN :
1078-8743
Print_ISBN :
0-7803-2713-6
Type :
conf
DOI :
10.1109/ASMC.1995.484338
Filename :
484338
Link To Document :
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