DocumentCode :
3223794
Title :
Characterization of Thermal Interface Materials
Author :
Schacht, R. ; May, D. ; Wunderle, B. ; Wittier, O. ; Gollhardt, A. ; Michel, Bruno ; Reichl, H.
Author_Institution :
Fraunhofer Inst. for Reliability & Micro Integration, Berlin
Volume :
2
fYear :
2006
fDate :
5-7 Sept. 2006
Firstpage :
1367
Lastpage :
1373
Abstract :
In this paper new characterization equipment for thermal interface materials is presented. Thermal management of electronic products relies on the effective dissipation of heat. This can be achieved by the optimization of the system design with the help of simulation methods. The precision of these models relies also on the used material data. For the determination of this data an experimental set-up for a static measurement is presented, which evaluate thermal conductivity of thermal interface materials (e.g. adhesive, solder, pads, or pastes). The paper gives an overview over the set-up and the measurement technique and discusses experimental and simulation results
Keywords :
cooling; electronic products; thermal conductivity; thermal management (packaging); electronic products; heat dissipation; static measurement; thermal conductivity; thermal interface materials; thermal management; Assembly; Conducting materials; Electrical resistance measurement; Heat sinks; Optical materials; Silicon; Thermal conductivity; Thermal management; Thermal management of electronics; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Systemintegration Technology Conference, 2006. 1st
Conference_Location :
Dresden
Print_ISBN :
1-4244-0552-1
Type :
conf
DOI :
10.1109/ESTC.2006.280189
Filename :
4060914
Link To Document :
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