Title :
Digital static calibration technology used for 400MSPS, 16-bit DAC
Author :
Dongmei, Zhu ; Dongbing, Fu ; Jiangang, Shi ; Kaicheng, Li
Author_Institution :
Nat. Labs. of Analog Integrated Circuits, Sichuan Inst. of Solid-state Circuits, Chongqing, China
Abstract :
In this study, the digital static calibration technique used for 400MSPS, 16-bit high-resolution current steering DAC is described. The technique uses address generator, comparator, SAR register, and calibration DAC to comprise successive approximation calibration loop. With the calibration loop, the respective calibration of array units of current source can be implemented automatically one by one, thus improving greatly matchable performance of current source. The differential nonlinearity error of 16-bit current steering DAC with the calibration technology reaches a true 16-bit relative static resolution with DNL<±0.5LSB.
Keywords :
calibration; constant current sources; digital-analogue conversion; 16-bit high-resolution current steering DAC; 400MSPS; SAR register; address generator; calibration DAC; calibration loop; comparator; differential nonlinearity error; digital static calibration technology; digital-to-analog converter; Analog integrated circuits; Calibration; Equations; Frequency domain analysis; Fuses; MOSFETs; Manufacturing processes; Signal resolution; Solid state circuits; Testing; DC resolution; DNL; SAR; current steering DAC; digital static calibration; mismatch;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-4297-3
Electronic_ISBN :
978-1-4244-4298-0
DOI :
10.1109/EDSSC.2009.5394183
