• DocumentCode
    3224649
  • Title

    Material engineering in phase-change memory for low power consumption and multi-level storage

  • Author

    Yin, You ; Noguchi, Tomoyuki ; Ohno, Hiroki ; Hosaka, Sumio

  • Author_Institution
    Dept. of Production Sci. & Technol., Gunma Univ., Kiryu, Japan
  • fYear
    2009
  • fDate
    25-27 Dec. 2009
  • Firstpage
    449
  • Lastpage
    452
  • Abstract
    We investigated the influence of the phase-change materials on the performance of memory devices for low power consumption and multi-level storage. Doping N into chalcogenide phase-change materials results in higher resistivity and low-response for temperature. The former characteristic leads to high heating efficiency for phase change and thus reduces the power consumption to about 1/10. The latter characteristic makes it easier to control phase change process in the memory device for multi-level storage. By adopting a top heater structure, 16 distinct resistance levels are demonstrated in our lateral device.
  • Keywords
    crystallisation; low-power electronics; nitrogen; phase change materials; phase change memories; chalcogenide phase-change materials; multi-level storage; phase-change memories; resistance levels; Conductivity; Doping; Energy consumption; Heating; Material storage; Phase change materials; Phase change memory; Power engineering and energy; Process control; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-4297-3
  • Electronic_ISBN
    978-1-4244-4298-0
  • Type

    conf

  • DOI
    10.1109/EDSSC.2009.5394221
  • Filename
    5394221