DocumentCode
3224734
Title
Co-extraction method for DC model parameters of BJT based on global optimization and physical analysis
Author
Sun, Jiwei ; Jia, Xinzhang ; Li, Zhiyun ; You, Hailong
Author_Institution
Sch. of Microelectron., Xidian Univ., Xi´´an, China
fYear
2009
fDate
25-27 Dec. 2009
Firstpage
433
Lastpage
436
Abstract
Based on the SPICE BJT models, a new co-extraction method for DC model parameters of BJT is proposed. From measured terminal characteristics data of BJT, the Model Editor, a model parameters extraction tool provided by PSpice, uses group extraction method to obtain DC model parameter values. But, actual situations show that there is a large error between the output characteristics determined by the model parameters extracted by Model Editor and the measured output characteristics. In order to obtain the most optimal values, it is necessary to use Optimizer tool to furthermore globally optimize for all the DC model parameters from parts of results of Model editor. And because the selection of initial values is important to optimization results, based on the physical processes of BJT, most DC model parameters close to the most optimal values are calculated as the initial values of optimization. Thus, the new co-extraction method improves extraction accuracy and efficiency without introducing complex mathematic optimization arithmetic.
Keywords
SPICE; bipolar transistors; optimisation; BJT models; DC model parameters; SPICE; coextraction method; complex mathematic optimization arithmetic; global optimization; model editor; physical analysis; Data mining; Integrated circuit modeling; Mathematical model; Mathematics; Microelectronics; Optimization methods; Parameter extraction; Region 3; SPICE; Sun; BJT; Model Editor; Optimizer tool; extraction; initial values; model parameter; optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of
Conference_Location
Xi´an
Print_ISBN
978-1-4244-4297-3
Electronic_ISBN
978-1-4244-4298-0
Type
conf
DOI
10.1109/EDSSC.2009.5394225
Filename
5394225
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