• DocumentCode
    3224789
  • Title

    An accurate analytical model for current-voltage characteristics and transconductance of AlmGa1−m/GaN MODFETs

  • Author

    Abtahi Hosseini, S.E. ; Hosseini, Seyed Ebrahim

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Sabzevar, Sabzevar, Iran
  • fYear
    2009
  • fDate
    25-27 Dec. 2009
  • Firstpage
    412
  • Lastpage
    415
  • Abstract
    In this paper, a simple and accurate analytical model for current-voltage and Transconductance characteristics of AlmGa1-m/GaN modulation doped field effect transistors (MODFETs) devices is presented. In proposed model, the effects of spontaneous and piezoelectric polarization at the hetero-interface and gate-voltage dependence of the Fermi level are considered. Variation of drain current after saturation, parasitic resistance of drain and source, field-dependent mobility, are contained in the model and gate to source dependant is utilized for the low field mobility. By implement model in MATLAB current-voltage characteristics and transconductance have been obtained. The agreement between the model and experimental result validate the proposed analytical model.
  • Keywords
    Fermi level; III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; AlGa-GaN; Fermi level; MATLAB; MODFET; current-voltage characteristics; drain current; field-dependent mobility; modulation doped field effect transistors; parasitic resistance; piezoelectric polarization; spontaneous polarization; transconductance; Analytical models; Current-voltage characteristics; Epitaxial layers; FETs; Gallium nitride; HEMTs; MODFETs; Mathematical model; Piezoelectric polarization; Transconductance; AlGaN/GaN; MODFET; low-field mobility; sheet carrier concentration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-4297-3
  • Electronic_ISBN
    978-1-4244-4298-0
  • Type

    conf

  • DOI
    10.1109/EDSSC.2009.5394228
  • Filename
    5394228