Title :
Crystallographic image processing for Scanning Probe Microscopy: Development of a dedicated computer program
Author :
Bilyeu, Taylor T. ; Moon, Bill, Jr. ; Straton, Jack C. ; Moeck, Peter
Author_Institution :
Dept. of Phys., Portland State Univ., Portland, OR, USA
Abstract :
The crystallographic processing of 2D periodic Scanning Probe Microscopy (SPM) images is compared to the common practice of Crystallographic Image Processing (CIP) in transmission electron microscopy (TEM). This provides motivation for the development of a dedicated computer program for CIP in SPM. The current state of our program is briefly described, and the point spread function (PSF) of an atomic force microscope (AFM) is extracted from experimental images through CIP. The use of a geometric Akaike information criterion (AIC) to supplement standard CIP procedures is discussed in some detail.
Keywords :
atomic force microscopy; crystallography; image processing; optical transfer function; transmission electron microscopy; 2D periodic scanning probe microscopy images; AFM; AIC; CIP; SPM images; TEM; atomic force microscope; computer program; crystallographic image processing; geometric Akaike information criterion; point spread function; transmission electron microscopy; Calibration; Communities; Lattices; Microscopy; Shape; Vectors; Image Processing; Scanning Probe Microscopy;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
DOI :
10.1109/NANO.2011.6144352
