Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling

Author

Hairoud, Siham ; Dubois, T. ; Tetelin, Angelique ; Duchamp, G.

Author_Institution

IMS, Univ. Bordeaux, Talence, France

fYear

2013

fDate

15-18 Dec. 2013

Firstpage

53

Lastpage

58

Abstract

This paper presents an application of the ICIM-CI model to the prediction of the susceptibility of ICs (Integrated Circuits) to environmental disturbances in avionic boards. The method is illustrated by the obsolescence study of three commercial operational amplifiers (Op-Amps) showing quasi-identical electrical characteristics and pin-to-pin compatibility, through the comparison of their respective conducted immunities. The model is developed in VHDL-AMS language, and the simulation results are validated through comparison with Direct Power Injection measurements.

Keywords

electromagnetic compatibility; hardware description languages; immunity testing; integrated circuit modelling; operational amplifiers; DPI measurement technique; VHDL-AMS modeling; avionic boards; conducted immunity; environmental disturbances; integrated circuit susceptibility; op-amps; pin-to-pin compatibility; quasiidentical electrical characteristics; Immunity testing; Integrated circuit modeling; Mathematical model; Power measurement; Voltage measurement; EMC; ICIM-CI; Integrated-circuit; Op- Amps; VHDL-AMS; immunity measurement and modeling; obsolescence;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on

Conference_Location

Nara

Type

conf

DOI

10.1109/EMCCompo.2013.6735172

Filename

6735172