Title :
Considerations in selecting a design-for-testability technique
Author_Institution :
Digital Equipment Corp., Colorado Springs, CO, USA
Abstract :
The four major design-for-testability (DFT) techniques-ad hoc, built-in-self-test (BIST), structured, and semistructured approaches-differ widely in their ability to meet a products test needs. A few practical guidelines can aid in choosing the DFT approach that is best for your project. The techniques are reviewed, followed by a description of the selection criteria, and concluding with the various DFT techniques being compared using the criteria to do the tradeoff analysis
Keywords :
electronic equipment testing; network synthesis; ad hoc technique; built-in-self-test; design-for-testability technique; semistructured approach; structured technique; tradeoff analysis; Application specific integrated circuits; Automatic testing; Built-in self-test; Circuit testing; Costs; Design for testability; Guidelines; Integrated circuit testing; Logic testing; Manufacturing;
Conference_Titel :
IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'
Conference_Location :
Colorado Springs, CO
DOI :
10.1109/REG5.1988.15921
