DocumentCode :
3225928
Title :
Heat transfer in evaporation in dielectric liquid films in different atmospheres using silicon testchips
Author :
Kristiansen, H. ; Bjorneklett, A.
Author_Institution :
Center for Ind. Res., Oslo, Norway
fYear :
1993
fDate :
2-4 Feb 1993
Firstpage :
144
Lastpage :
150
Abstract :
A possible solution for cooling a large silicon detector system is discussed. The idea is to use evaporation cooling from liquid films deposited directly on the VLSI circuits. The intention is to feed liquid to each individual VLSI, using a combination of a liquid pipe line and a wick structure. The liquid which is deposited on the VLSI is then evaporated into an atmosphere consisting of vapor and possibly nitrogen. The heat transfer from liquid films deposited on silicon test chips is reported. Both pure vapor and a mixed vapor and nitrogen atmosphere have been used. The total pressure and thereby the liquid saturation temperature was varied during the different experiments. To increase the heat transfer coefficient at low heat fluxes, different modifications of the silicon surface were introduced in some of the experiments
Keywords :
VLSI; cooling; dielectric thin films; evaporation; liquid films; VLSI circuits; cooling; detector system; dielectric liquid films; heat fluxes; heat transfer; heat transfer coefficient; liquid pipe line; liquid saturation temperature; pure vapor; test chips; wick structure; Atmosphere; Circuits; Cooling; Detectors; Dielectric liquids; Feeds; Heat transfer; Nitrogen; Silicon; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1993. SEMI-THERM IX., Ninth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-0863-8
Type :
conf
DOI :
10.1109/STHERM.1993.225320
Filename :
225320
Link To Document :
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