• DocumentCode
    3226039
  • Title

    Atto-Joule gates for the whole voltage range

  • Author

    Beiu, Valeriu ; Beg, Azam ; Ibrahim, Walid

  • Author_Institution
    Dept. of Comput. Eng., United Arab Emirates Univ., Al Ain, United Arab Emirates
  • fYear
    2011
  • fDate
    15-18 Aug. 2011
  • Firstpage
    1424
  • Lastpage
    1429
  • Abstract
    Reducing the supply voltage is by far the most widely used low-power technique, as reducing dynamic power quadratically and leakage power linearly, while sacrificing on performances. A similar but less explored route is to reduce and/or limit currents (instead of reducing voltages), e.g., through transistor sizing. This paper details a comparison of a reverse-sized CMOS scheme (which reduces currents), with both a classical CMOS implementation and an ultra low power (ULP) sub-threshold CMOS scheme. Simulation results show that the reverse-sized CMOS inverter performs well over the whole range of supply voltages: (i) it dissipates significantly less than a classical CMOS inverter (20-60×), while it does degrade performances (5-20×) but less than power gaining, i.e., not proportionally; (ii) it is much faster (100-200×) than a ULP inverter, at moderately larger power consumptions (10-40×), but again less than proportional; and (iii) its power-delay-product (PDP) is constantly 5-8× lower than that of the other two inverters considered over the whole range of supply voltages. In particular, a reverse-sized CMOS inverter in 16nm at 300mV has a delay of 9.16ns while breaking the atto-Joule barrier (0.906aJ).
  • Keywords
    CMOS integrated circuits; invertors; low-power electronics; atto-Joule gates; dynamic power reduction; energy 0.906 aJ; leakage power reduction; low-power technique; power-delay-product; reverse-sized CMOS inverter; size 16 nm; supply voltage; time 9.16 ns; ultra low power sub-threshold CMOS scheme; voltage 300 mV; CMOS integrated circuits; CMOS technology; Delay; Integrated circuit reliability; Inverters; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
  • Conference_Location
    Portland, OR
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4577-1514-3
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2011.6144399
  • Filename
    6144399