DocumentCode :
3226068
Title :
Thermal characterization of surface mount devices
Author :
Siegal, Bernard S.
Author_Institution :
Optical Associates Inc., Milpitas, CA, USA
fYear :
1993
fDate :
2-4 Feb 1993
Firstpage :
99
Lastpage :
107
Abstract :
A methodology for the thermal characterization of surface mount devices (SMDs) is proposed. Measured data are shown only for the relative evaluation of various thermal test conditions and environments. Specific topics covered include the design of a suitable thermal test board; the mounting and orientation of the device for the thermal measurement in still and moving air environments; and collection, analysis and presentation of the data and detailed documentation of the test conditions and environment. The latter is especially important if the measurements are to be repeated by the SMD vendor or duplicated by the SMD user. The thermal test board design is discussed from the standpoint of existing standards and low-cost alternatives. The moving air environment, implemented with a variation of an industry standard design and designed to provide up to 1000 linear feet per minute capability, is discussed with the intent of establishing a new industry standard design
Keywords :
printed circuit testing; production testing; surface mount technology; thermal analysis; SMD; industry standard design; surface mount devices; test conditions; thermal characterization; thermal test board; thermal test conditions; Circuit testing; Electronic equipment; Electronic equipment testing; Electronic packaging thermal management; Electronics industry; Integrated circuit measurements; Integrated circuit testing; Packaging machines; Semiconductor device measurement; Semiconductor device packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1993. SEMI-THERM IX., Ninth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-0863-8
Type :
conf
DOI :
10.1109/STHERM.1993.225326
Filename :
225326
Link To Document :
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