• DocumentCode
    3226118
  • Title

    Temperature sensitivity to node spacing in ASTAP finite difference modelling for flat cap single- and multi-chip modules

  • Author

    Arbeitman, Kenneth J.

  • Author_Institution
    IBM East Fishkill, Hopewell Junction, NY, USA
  • fYear
    1993
  • fDate
    2-4 Feb 1993
  • Firstpage
    81
  • Lastpage
    87
  • Abstract
    Examines the sensitivity of ASTAP (Advanced Statistical Analysis Program) chip temperatures to model mesh size (node spacing) for flat cap single- and multichip modules and develops guidelines for mesh size selection which ensure a certain level of model accuracy without wasting resources with unnecessary model complication. Temperature output from models generated with the ASTAP model preprocessor (AMP) are first verified against the results from a finite-element modeling package. ASTAP chip temperatures as a function of node spacing are plotted. Optimum node spacing is determined as being where chip temperature variability decreases below the order of a user-defined value for all chips on a module. Guidelines are recommended for the most efficient mesh size selection as a function of module size, maximum chip power density, and maximum vertical chip attach 1D thermal resistances on the module
  • Keywords
    finite difference methods; finite element analysis; multichip modules; packaging; ASTAP finite difference modelling; Advanced Statistical Analysis Program; chip power density; chip temperatures; finite-element modeling package; flat-cap single-chip modules; maximum vertical chip attach 1D thermal resistances; mesh size; model accuracy; module size; multi-chip modules; node spacing; Circuit analysis computing; Computer industry; Conducting materials; Finite difference methods; Finite element methods; Guidelines; Packaging; Solid modeling; Statistical analysis; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1993. SEMI-THERM IX., Ninth Annual IEEE
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-0863-8
  • Type

    conf

  • DOI
    10.1109/STHERM.1993.225328
  • Filename
    225328