DocumentCode
3226125
Title
Thermal and package design of high power laser diodes
Author
Lee, Chin C. ; Chien, David H.
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
fYear
1993
fDate
2-4 Feb 1993
Firstpage
75
Lastpage
80
Abstract
Thermal and package design is carried out for high power laser diodes. Both junction-up and flip-chip configurations are studied. The flip-chip technique is far superior to the junction-up method. For a 300-μm(L)×500-μm(W) GaAs laser diode chip with active region of 300 μm(L)×5 μm(W), the flip-chip design gives a thermal resistance of 30.14°C/W using a diamond heat sink, and 41.72°C/W using a copper-tungsten heat sink. Calculated result shows that the temperature along the active region is uniform for uniform heat flux. It is thus recommended that the laser chip be designed with uniform heat flux rather than uniform current density along the active region. A technology is suggested to perform flip-chip bonding of the laser chip without incurring the danger of solder getting onto the laser facets
Keywords
flip-chip devices; heat sinks; packaging; semiconductor lasers; Cu-W; GaAs; active region; copper-tungsten heat sink; diamond heat sink; flip-chip bonding; flip-chip configurations; high power laser diodes; junction-up configurations; package design; thermal design; thermal resistance; uniform heat flux; Bonding; Current density; Diode lasers; Gallium arsenide; Heat sinks; Optical design; Packaging; Resistance heating; Temperature; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1993. SEMI-THERM IX., Ninth Annual IEEE
Conference_Location
Austin, TX
Print_ISBN
0-7803-0863-8
Type
conf
DOI
10.1109/STHERM.1993.225329
Filename
225329
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