• DocumentCode
    3226125
  • Title

    Thermal and package design of high power laser diodes

  • Author

    Lee, Chin C. ; Chien, David H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
  • fYear
    1993
  • fDate
    2-4 Feb 1993
  • Firstpage
    75
  • Lastpage
    80
  • Abstract
    Thermal and package design is carried out for high power laser diodes. Both junction-up and flip-chip configurations are studied. The flip-chip technique is far superior to the junction-up method. For a 300-μm(L)×500-μm(W) GaAs laser diode chip with active region of 300 μm(L)×5 μm(W), the flip-chip design gives a thermal resistance of 30.14°C/W using a diamond heat sink, and 41.72°C/W using a copper-tungsten heat sink. Calculated result shows that the temperature along the active region is uniform for uniform heat flux. It is thus recommended that the laser chip be designed with uniform heat flux rather than uniform current density along the active region. A technology is suggested to perform flip-chip bonding of the laser chip without incurring the danger of solder getting onto the laser facets
  • Keywords
    flip-chip devices; heat sinks; packaging; semiconductor lasers; Cu-W; GaAs; active region; copper-tungsten heat sink; diamond heat sink; flip-chip bonding; flip-chip configurations; high power laser diodes; junction-up configurations; package design; thermal design; thermal resistance; uniform heat flux; Bonding; Current density; Diode lasers; Gallium arsenide; Heat sinks; Optical design; Packaging; Resistance heating; Temperature; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1993. SEMI-THERM IX., Ninth Annual IEEE
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-0863-8
  • Type

    conf

  • DOI
    10.1109/STHERM.1993.225329
  • Filename
    225329