DocumentCode :
3226160
Title :
Thermal wake models for forced air cooling of electronic components
Author :
Ortega, Alfonso ; Ramanathan, Shankar ; Chicci, John D. ; Prince, John L.
Author_Institution :
Center for Electron. Packaging Res., Arizona Univ., Tucson, AZ, USA
fYear :
1993
fDate :
2-4 Feb 1993
Firstpage :
63
Lastpage :
74
Abstract :
Analytical solutions are presented for the temperature field which arises from the application of a source of heat on an adiabatic plate or board when the fluid is represented as a uniform flow with an effective turbulent diffusivity, the so-called UFED flow model. Solutions are summarized for a point source, a one-dimensional strip source, and a rectangular source of heat. The ability to superpose the individual kernel solutions to obtain the temperature field due to multiple sources is demonstrated. The point source solution reveals that the N-1 law commonly observed for the centerline thermal wake decay for three-dimensional arrays is predicted by the point source solution for the UFED model. The thermal wake approaches the point source behavior downstream from the source, suggesting a new scaling for the far thermal wake that successfully collapses the thermal wake for several sizes of components and provides a fundamental basis for experimental observations previously made for arrays of three-dimensional components. Preliminary experimental results using a thermochromic liquid crystal thermal mapping technique are presented
Keywords :
cooling; packaging; thermal analysis; UFED flow model; adiabatic plate; centerline thermal wake decay; effective turbulent diffusivity; electronic components; far thermal wake; forced air cooling; kernel solutions; one-dimensional strip source; packaging; point source; rectangular source; temperature field; thermal mapping technique; thermochromic liquid crystal; uniform flow; Computational fluid dynamics; Electronic components; Electronic packaging thermal management; Electronics cooling; Electronics packaging; Heat transfer; Predictive models; Temperature; Thermal conductivity; Thermal force;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1993. SEMI-THERM IX., Ninth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-0863-8
Type :
conf
DOI :
10.1109/STHERM.1993.225330
Filename :
225330
Link To Document :
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