Title :
Noise analysis using on-chip waveform monitor in bandgap voltage references
Author :
Murata, Atsuo ; Agatsuma, Shuji ; Ikoma, Daisaku ; Ichikawa, Kazuhisa ; Tsuda, Toshitaka ; Nagata, M. ; Yoshikawa, Kenichi ; Araga, Yuuki ; Harada, Y.
Author_Institution :
DENSO Corp., Kariya, Japan
Abstract :
In this paper, the susceptibility of a CMOS bandgap voltage reference (BGR) to external noise was investigated using an on-chip waveform monitor circuit in conjunction with circuit simulations. A Direct RF Power Injection method was employed for the immunity test of the BGR. Also, we evaluated the performance of the on-chip waveform monitor and analyze the BGR immunity using the on-chip monitor. As the results, we have clarified the mechanism of the BGR malfunction. The output voltage drop of the BGR was caused by the offset of operational amplifier in BGR.
Keywords :
CMOS analogue integrated circuits; circuit simulation; integrated circuit noise; operational amplifiers; reference circuits; BGR immunity; CMOS bandgap voltage reference; circuit simulations; direct RF power injection; external noise; immunity test; noise analysis; on-chip waveform monitor circuit; operational amplifier; Immunity testing; Monitoring; Noise; Radio frequency; System-on-chip; Voltage measurement; bandgap voltage reference; immunity; on-chip waveform monitor; vehicle;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
Conference_Location :
Nara
DOI :
10.1109/EMCCompo.2013.6735205
