DocumentCode :
3226262
Title :
Thermal performance of an integral immersion cooled multichip module package
Author :
Nelson, Richard D. ; Sommerfeldt, Scott ; BarCohen, A.
Author_Institution :
Microelectronics & Computer Technology Corp., Austin, TX, USA
fYear :
1993
fDate :
2-4 Feb 1993
Firstpage :
8
Lastpage :
18
Abstract :
A multichip module (MCM) package which uses integral immersion cooling to transfer heat from the chips to a final heat transfer medium outside the package was constructed. The package is a miniature immersion-cooled system with a pin-fin condenser which can be operated in either the submerged or vapor-space condensing mode. Sixteen chips were bonded on a 57 mm2 alumina substrate carrying copper/polyimide thin film interconnect. Tests of the thermal performance of the system show that it is capable of handling over 160 W power with chip thermal resistances as low as 2 K-cm2/W provided by the immersion cooled portion of the thermal path. Tests performed with the module fully powered and with subsets of the chips powered indicate that the heat transfer coefficient is similar in all partially powered modes. Data taken with condenser temperatures ranging from 20 to 50°C were used to obtain a performance map delineating the heat transfer regimes in the module and the limits imposed by critical heat flux and condenser performance
Keywords :
cooling; multichip modules; packaging; 160 W; 20 to 50 degC; chip thermal resistances; condenser performance; copper/polyimide thin film interconnect; critical heat flux; heat transfer coefficient; heat transfer medium; heat transfer regimes; integral immersion cooled; multichip module package; partially powered modes; pin-fin condenser; vapor-space condensing mode; Bonding; Copper; Heat transfer; Immersion cooling; Multichip modules; Packaging; Polyimides; Substrates; Thermal resistance; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1993. SEMI-THERM IX., Ninth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-0863-8
Type :
conf
DOI :
10.1109/STHERM.1993.225336
Filename :
225336
Link To Document :
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