DocumentCode :
3226838
Title :
Self-assembled NEMS for pN force detection
Author :
Rathfon, Jeremy M. ; Yan, Minhao ; Berret, Jean-François ; Cohn, Robert W.
Author_Institution :
ElectroOptics Res. Inst., Univ. of Louisville, Louisville, KY, USA
fYear :
2011
fDate :
15-18 Aug. 2011
Firstpage :
172
Lastpage :
175
Abstract :
Hand brushing of a 3 wt% aqueous solution of polyethylene oxide over a micropillar array, produces a bead-on-a-string (BOS) NEMS structure through a process of capillary-driven self-assembly. The structure is unique in that the highly entangled polymer chains lead to the formation of a nanofiber, 50 - 200 nm diameter, that supports a 10 - 25 micron bead at its midpoint. These structures form even with the inclusion in the polymeric solution of magnetic iron oxide nanoparticles and nanorods below a critical length. The measured force-displacement response (to air streams and magnetic fields) is on the order of 10 picoNewton per micron (pN/μm); i.e., 10 pN, the limiting sensitivity of commercial atomic force microscopes, would be readily detectable under optical microscopes.
Keywords :
nanoelectromechanical devices; nanofibres; nanorods; self-assembly; bead-on-a-string NEMS structure; capillary-driven self-assembly; force-displacement response; hand brushing; magnetic iron oxide nanoparticles; magnetic iron oxide nanorods; micropillar array; nanofiber; pN force detection; polyethylene oxide; self-assembled NEMS; size 10 micron to 25 micron; size 50 nm to 200 nm; Fiber optics; Force; Magnetic force microscopy; Microscopy; Optical fiber sensors; Optical microscopy; Polymers; NEMS; polymers; self-assembly; sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
ISSN :
1944-9399
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2011.6144435
Filename :
6144435
Link To Document :
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