Title :
On-line automated inspection based on image digitization boards
Author :
Marino, Perfecto N. ; Dominguez, Miguel Angel
Author_Institution :
Electron. Technol. Dept., Vigo Univ., Spain
Abstract :
The authors have been involved in the implementation of a total quality control project in communications equipment company, whose products are mounted and tested in a manufacturing plant controlled by an IBM Token Ring LAN. The most significant products are RF and microwave amplifier boards for satellite TV receivers, with electronic components based on SMT technology. The first implementation of total quality control project was an ATE (automatic test equipment) LAN node that runs a program of verification for single-channel and multichannel electronic amplifiers, in which bandwidth is in the TV spectrum (50+850 MHz). This ATE LAN node is supported in its performance for an RF analyzer connected to it through an IEEE 388 bus. The last implementation is an automated inspection LAN node to detect the missing of SMT and non SMT components mounted in the electronic cards of above mentioned amplifiers. This LAN node for automated inspection is based on artificial vision and will be called MVI (Machine-Vision Inspection)
Keywords :
automatic optical inspection; automatic test equipment; local area networks; microwave amplifiers; quality control; radiofrequency amplifiers; surface mount technology; telecommunication equipment testing; television receivers; IBM Token Ring LAN; IEEE 388 bus; Machine-Vision Inspection; RF amplifier boards; RF analyzer; SMT technology; artificial vision; automated inspection; communications equipment company; image digitization boards; microwave amplifier boards; missing components detection; multichannel electronic amplifiers; on-line automated inspection; satellite TV receivers; single-channel electronic amplifiers; total quality control project; Automatic control; Communication equipment; Electronic equipment manufacture; Inspection; Local area networks; Quality control; Radio frequency; Radiofrequency amplifiers; Surface-mount technology; Testing;
Conference_Titel :
Industrial Electronics, Control and Instrumentation, 1997. IECON 97. 23rd International Conference on
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-3932-0
DOI :
10.1109/IECON.1997.668470
