Study of nonlinear modeling for microwave diode based measurement

Author

Liang, Anhui ; Xu, Yanfeng ; Sun, Guoquan

Author_Institution

Qingdao Econ. & Technol. Dev. Zone, Nat. Key Lab. of Sci. & Technol. on Electron. Test & Meas., Qingdao, China

fYear

2010

fDate

8-11 May 2010

Firstpage

1080

Lastpage

1082

Abstract

Nonlinear modeling of microwave diode is discussed in this paper. A measurement system is set up based on the conception of nonlinear scattering functions and the principle of measuring is introduced. A microwave schottky diode´s partial scattering functions is extracted and compared with the simulated results in Serenade and results agree well. Nonlinear scattering functions can be used as a new tool to character nonlinear microwave device and our system can extract scattering functions accurately.

Keywords

Schottky diodes; electromagnetic wave scattering; microwave measurement; measurement system; microwave Schottky diode based measurement; nonlinear microwave device; nonlinear modeling; nonlinear scattering functions; partial scattering functions; Analytical models; Laboratories; Microwave devices; Microwave measurements; Microwave technology; Phase measurement; Scattering; Schottky diodes; Sun; Time measurement; Nonlinear Scattering Functions; Schottky diode; modeling; set-up;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-5705-2

Type

conf

DOI

10.1109/ICMMT.2010.5524732

Filename

5524732