Title :
Study of nonlinear modeling for microwave diode based measurement
Author :
Liang, Anhui ; Xu, Yanfeng ; Sun, Guoquan
Author_Institution :
Qingdao Econ. & Technol. Dev. Zone, Nat. Key Lab. of Sci. & Technol. on Electron. Test & Meas., Qingdao, China
Abstract :
Nonlinear modeling of microwave diode is discussed in this paper. A measurement system is set up based on the conception of nonlinear scattering functions and the principle of measuring is introduced. A microwave schottky diode´s partial scattering functions is extracted and compared with the simulated results in Serenade and results agree well. Nonlinear scattering functions can be used as a new tool to character nonlinear microwave device and our system can extract scattering functions accurately.
Keywords :
Schottky diodes; electromagnetic wave scattering; microwave measurement; measurement system; microwave Schottky diode based measurement; nonlinear microwave device; nonlinear modeling; nonlinear scattering functions; partial scattering functions; Analytical models; Laboratories; Microwave devices; Microwave measurements; Microwave technology; Phase measurement; Scattering; Schottky diodes; Sun; Time measurement; Nonlinear Scattering Functions; Schottky diode; modeling; set-up;
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
DOI :
10.1109/ICMMT.2010.5524732
