DocumentCode :
3226994
Title :
Bayes sequential test based NLOS localization method for wireless sensor network
Author :
Yan Wang ; Long Cheng ; Nan Hu
Author_Institution :
Dept. of Comput. & Commun. Eng., Northeastern Univ., Qinhuangdao, China
fYear :
2015
fDate :
23-25 May 2015
Firstpage :
5230
Lastpage :
5234
Abstract :
The localization is a key technology for wireless sensor network (WSN). The accuracy of localization is high in line of sight (LOS) propagation between the beacon node and unknown node. The NLOS propagation severely degrades the accuracy of localization. Therefore, the NLOS localization is one of the important challenges for WSN. In this paper, we firstly employ the Bays sequential test method to identify the propagation condition of beacon node. Then NLOS measurements which contain the NLOS error are corrected by subtracting the mean of NLOS errors to mitigate the impact of the NLOS propagation. Finally the simulation results show that the proposed method owns relatively higher localization accuracy in compare with other methods.
Keywords :
Bayes methods; sensor placement; wireless sensor networks; Bayes sequential test method; NLOS error; NLOS localization; NLOS propagation; WSN; beacon node; line of sight propagation; localization accuracy; wireless sensor network; Accuracy; Mobile nodes; Noise; Noise measurement; Nonlinear optics; Wireless sensor networks; Bayes sequential test; Wireless sensor network; localization; mobile node; non-line of sight;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Decision Conference (CCDC), 2015 27th Chinese
Conference_Location :
Qingdao
Print_ISBN :
978-1-4799-7016-2
Type :
conf
DOI :
10.1109/CCDC.2015.7162857
Filename :
7162857
Link To Document :
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