DocumentCode :
3227092
Title :
Vapor phase SERS sensor for explosives detection
Author :
Tamane, S. ; Topal, C.O. ; Kalkan, A.K.
Author_Institution :
Mech. & Aerosp. Eng., Oklahoma State Univ., Stillwater, OK, USA
fYear :
2011
fDate :
15-18 Aug. 2011
Firstpage :
301
Lastpage :
306
Abstract :
In the present work, we employ “nanometal-on-semiconductor” SERS substrates to detect various explosives including TNT, PETN, RDX, and TNB in vapor phase at concentrations on the order of few ppb. The SERS substrates were prepared by a novel process, where a monolayer of surfactant-free Ag nanoparticles was reduced on a Si thin film. Our work also targets a clear understanding of the factors, which so far have limited vapor phase SERS of the explosives. In addition to low vapor pressure of explosives at room temperature, we identify other challenges on the basis of our kinetics study: 1) weak adsorption of the explosives on silver nanostructures that accounts for easy desorption even under low laser excitation; 2) photochemical decomposition of the explosives under the Raman laser; 3) multiple chemisorption configurations of an explosive molecule on the nanoparticle surface that complicate the SERS spectrum. Although SERS signals of the explosives show transients, reproducible fingerprint spectra can be obtained in the first 10 s.
Keywords :
Raman lasers; chemical sensors; chemisorption; explosive detection; photochemistry; spectrochemical analysis; surface enhanced Raman scattering; Ag; PETN; RDX; Raman laser; TNB; TNT; adsorption; chemisorption configuration; explosives detection; fingerprint spectra; nanometal-on-semiconductor SERS substrates; photochemical decomposition; surfactant free nanoparticle; temperature 293 K to 298 K; vapor phase SERS sensor; Explosives; Nanoparticles; Raman scattering; Silicon; Substrates; Temperature; Temperature measurement; Surface-enhanced Raman scattering; explosive; trace level detection; vapor phase;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
ISSN :
1944-9399
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2011.6144447
Filename :
6144447
Link To Document :
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