DocumentCode :
3227097
Title :
The microwave noise characteristics of InAlN/GaN HEMTs
Author :
Chen, Yongbo ; Guo, Yunchuan ; Huang, Wen ; Xu, Ruimin
Author_Institution :
EHF Key Lab. of Fundamental Sci., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear :
2010
fDate :
8-11 May 2010
Firstpage :
1710
Lastpage :
1714
Abstract :
The microwave noise characteristics of InAlN/GaN heterojunction HEMTs are analysed by using an equivalent circuit model in this paper. It shows that the minimum noise figure of InAlN/GaN HEMTs can be comparable with that of AlGaN/GaN HEMTs at X-band and higher frequency band. However, at the lower microwave frequency band, the minimum noise figure of InAlN/GaN HEMTs is a little worse, the reason of which is because of its high gate-leakage current. At last, three proposals are provided to improve the noise characteristics of InAlN/GaN HEMTs.
Keywords :
aluminium compounds; gallium compounds; high electron mobility transistors; indium compounds; leakage currents; microwave field effect transistors; noise; AlGaN; HEMT; InAlN; X-band frequency; equivalent circuit model; gate leakage current; heterojunction HEMT; microwave frequency band; microwave noise characteristics; minimum noise figure; Aluminum gallium nitride; Circuit noise; Equivalent circuits; Gallium nitride; HEMTs; Heterojunctions; MODFETs; Microwave frequencies; Noise figure; Proposals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
Type :
conf
DOI :
10.1109/ICMMT.2010.5524738
Filename :
5524738
Link To Document :
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