Title :
Machine vision system for total quality control of SMT electronic cards
Author :
Mariño, Perfecto ; Domínguez, Miguel Angel
Author_Institution :
Electron. Technol. Dept., Vigo Univ., Spain
Abstract :
The authors have been involved in the implementation of a total quality control project in a communications equipment company whose products are mounted and tested in a manufacturing plant controlled by an IBM token ring LAN. The most significant products are RF and microwave amplifier boards for satellite TV receivers, with electronic components based on SMT technology. The first implementation of the total quality control project was an ATE (automatic test equipment) LAN node that runs a program for the verification of single-channel and multichannel electronic amplifiers, whose bandwidth is in the TV spectrum (50+850 MHz). This ATE LAN node is supported in its performance by an RF analyzer connected to it through an IEEE 488 bus. The final implementation is an automated inspection LAN node to detect missing SMT and non-SMT components mounted on the electronic cards of the above-mentioned amplifiers. This LAN node for automated inspection is based on artificial vision and is to be called MVI (Machine-Vision Inspection)
Keywords :
automatic optical inspection; automatic test equipment; computer vision; electronic engineering computing; local area networks; peripheral interfaces; quality control; radiofrequency amplifiers; surface mount technology; television receivers; token networks; 50 MHz; 850 MHz; ATE LAN node; IBM token ring LAN; IEEE 488 bus; Machine-Vision Inspection; RF amplifier boards; SMT electronic cards; amplifier verification program; artificial vision; automated inspection; automatic test equipment; bandwidth; communications equipment; electronic components; manufacturing plant; microwave amplifier boards; missing components detection; multichannel amplifiers; satellite TV receivers; single-channel amplifiers; surface mount technology; total quality control; Communication equipment; Electronic equipment manufacture; Inspection; Local area networks; Machine vision; Quality control; Radio frequency; Radiofrequency amplifiers; Surface-mount technology; Testing;
Conference_Titel :
Intelligent Processing Systems, 1997. ICIPS '97. 1997 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4253-4
DOI :
10.1109/ICIPS.1997.669253
