Title :
Assessment of conductive gaskets using X-ray fluorescence technique
Author :
Prakash, B.N. ; Roy, L. Dinesh
Author_Institution :
EMC Test Centre, Bharat Electron. Ltd., Bangalore, India
Abstract :
EMI control is a very crucial step in ensuring a satisfactory environment for the coexistence of different types of electrical/electronic equipment. At the equipment design stage, EMI control methods, such as grounding, bonding, filtering and shielding are used for achieving EMC. Conductive gaskets are used to reduce RF leakage at seams and joints, such as front panel mountings and cabinets etc. The shielding effectiveness (SE) of the gasket is a critical parameter which determines the adequacy for use in equipment. This paper describes the use of an indirect method namely the XRF technique, for determining the adequacy of conductive gaskets for use in equipment to reduce radiation related EMI problems
Keywords :
X-ray fluorescence analysis; conductors (electric); electromagnetic compatibility; electromagnetic interference; electromagnetic shielding; interference suppression; EMC; EMI control; RF leakage reduction; X-ray fluorescence technique; XRF technique; bonding; cabinets; conductive gaskets; electrical/electronic equipment; equipment design; filtering; front panel mountings; grounding; joints; radiation reduction; seams; shielding effectiveness; Conducting materials; Conductivity; Copper; Electromagnetic compatibility; Electronic equipment testing; Fluorescence; Gaskets; Materials testing; Radio frequency; Silver;
Conference_Titel :
Electromagnetic Interference and Compatibility '97. Proceedings of the International Conference on
Conference_Location :
Hyderabad
Print_ISBN :
81-900652-0-3
DOI :
10.1109/ICEMIC.1997.669746