• DocumentCode
    3228164
  • Title

    Co-tunneling effects on transport in the spin blockade regime

  • Author

    Oh, Jung Hyun ; Bubanja, Vladimir ; Shin, Mincheol ; Lee, Seok-Hee

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • fYear
    2011
  • fDate
    15-18 Aug. 2011
  • Firstpage
    1133
  • Lastpage
    1136
  • Abstract
    Using non-equilibrium Green´s function technique with auxiliary-particle operators, we study co-tunneling effects on transport through double quantum dots in the spin blockade regime. We construct the Luttinger-Ward functional by summing infinite number of Feynman diagrams under the non-crossing approximation and, thereby, tunneling currents are calculated in conservative ways for a finite Coulomb potential U. We find that co-tunneling results in Kondo resonance peaks along the chemical potential even in high bias voltages and leads to relatively large occupation probabilities of states which would be prohibited in sequential tunneling cases. As a result, conductance peaks are broadened and large leakage currents are found in the spin blockade regime, which may lead to errors in the spin read-out.
  • Keywords
    Coulomb blockade; Feynman diagrams; Green´s function methods; Kondo effect; approximation theory; chemical potential; electric admittance; electric potential; leakage currents; quantum dots; tunnelling; Feynman diagrams; Kondo resonance peaks; Luttinger-Ward functional; auxiliary-particle operators; bias voltages; chemical potential; conductance peaks; cotunneling effects; double quantum dots; finite Coulomb potential; leakage currents; noncrossing approximation; nonequilibrium Green´s function technique; sequential tunneling; spin blockade regime; spin read-out; state occupation probabilities; tunneling currents; Chemicals; Electric potential; Electrodes; Equations; Mathematical model; Quantum dots; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
  • Conference_Location
    Portland, OR
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4577-1514-3
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2011.6144495
  • Filename
    6144495