Effect of manganese and vanadium valences for the reliability of BaTiO3-based MLCCs

Author

Natsui, Hidesada ; Shibahara, Takeshi ; Kido, Osamu

Author_Institution

Mater. & Process Dev. Center, TDK Corp., Narita, Japan

fYear

2011

fDate

24-27 July 2011

Firstpage

1

Lastpage

4

Abstract

The valences of manganese and vanadium oxides in multi-layer ceramic capacitors (MLCCs), sintered under a reducing atmosphere, were investigated using electron paramagnetic resonance, the insulation resistance degradation was analyzed using impedance spectroscopy in highly accelerated life time tests to clarify the manganese and vanadium influence on both the electrical properties and microstructure of MLCCs. The Mn²⁺ was stable in the reducing-atmosphere-sintered MLCCs, and formed a grain boundary. Vanadium mitigated the IR degradation and increased the reliability of the MLCCs. Although V⁴⁺ was detected in the 0.20 and 0.30 mol% vanadium-added MLCCs, the electrical properties were dependant upon the other ions, e.g., V³⁺ or V⁵⁺.

Keywords

barium compounds; ceramic capacitors; grain boundaries; paramagnetic resonance; reliability; sintering; BaTiO₃; IR degradation; V³⁺ ion; V⁵⁺ ion; electron paramagnetic resonance; grain boundary; impedance spectroscopy; insulation resistance degradation; manganese oxide; manganese valence effect; microstructure; multilayer ceramic capacitors; reducing-atmosphere-sintered MLCC; reliability; sintering; vanadium oxide; vanadium valence effect; Ceramics; Degradation; Grain boundaries; Manganese; Reliability; Resistance; EPR; MLCCs; manganese; reliability; vanadium;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials

Conference_Location

Vancouver, BC

Print_ISBN

978-1-4577-1162-6

Electronic_ISBN

978-1-4577-1161-9

Type

conf

DOI

10.1109/ISAF.2011.6014101

Filename

6014101