DocumentCode :
3228224
Title :
Origin of low-frequency dielectric permittivity in BiFeO3 multiferroic ceramics
Author :
Tu, C.-S. ; Wang, T.-H. ; Schmidt, V.H. ; Chien, R.R.
Author_Institution :
Grad. Inst. of Appl. Sci. & Eng., Fu Jen Catholic Univ., Taipei, Taiwan
fYear :
2011
fDate :
24-27 July 2011
Firstpage :
1
Lastpage :
4
Abstract :
A one-dimensional conductivity barrier model is introduced to describe the dielectric response and conductivity of BiFeO3 (BFO) and (Bi0.95Nd0.05)FeO3 (BFO-5%Nd) ceramics as functions of temperature and frequency. Good qualitative fits of conductivity and dielectric permittivity in the intermediate-temperature region (500-800 K) are obtained with intrinsic barriers of B=8700 K (for BFO) and B=8400 K (for BFO-5%Nd), and extrinsic barriers of Δ=2500 K (for BFO and BFO-5%Nd). The phase-shifted conductivity is responsible for a step-like dielectric relaxation in the region of 500-800 K. The experimental conductivity departs from the conductivity-barrier-model fit below 650 K. This deviation is likely caused by the magneto-electric coupling near the antiferromagnetic-paramagnetic transition. This work suggests that the 5% mole Nd-substitution can stabilize the perovskite structure in BFO ceramic.
Keywords :
bismuth compounds; dielectric relaxation; electrical conductivity; ferroelectric ceramics; magnetoelectric effects; multiferroics; neodymium compounds; paramagnetic-antiferromagnetic transitions; permittivity; (Bi0.95Nd0.05)FeO3; 1D conductivity barrier model; BFO-Nd ceramics; BiFeO3; Nd-substitution; antiferromagnetic-paramagnetic transition; conductivity-barrier-model fit; dielectric response; extrinsic barriers; intermediate-temperature region; intrinsic barriers; low-frequency dielectric permittivity; magnetoelectric coupling; multiferroic ceramics; perovskite structure; phase-shifted conductivity; step-like dielectric relaxation; temperature 500 K to 800 K; Ceramics; X-ray scattering; BiFeO3; barrier model; dielectric permittivity; magneto-electric coupling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1162-6
Electronic_ISBN :
978-1-4577-1161-9
Type :
conf
DOI :
10.1109/ISAF.2011.6014103
Filename :
6014103
Link To Document :
بازگشت