Title :
Pressure-composition phase diagram of the Pb(Mg1/3Nb2/3)O3-PbTiO3 solid solutions
Author :
Ahart, Muhtar ; Cohen, R.E. ; Hemley, Russell J. ; Sinogeikin, Stanislav ; Shebanova, Olga ; Ikuta, Oaijo ; Ye, Z. -G
Author_Institution :
Geophys. Lab., Carnegie Instn. of Washington, Washington, DC, USA
Abstract :
We combine high-pressure x-ray diffraction, high-pressure Raman scattering, and optical microscopic methods to investigate a series of PMN-xPT solid solutions (x=0.2, 0.3, 0.33, 0.35, 0.37, 0.4) in diamond anvil cells up to 20 GPa at 300 K. The Raman spectra show a new peak centered at 380 cm-1 above 6 GPa for all samples, consistent with previous observations. X-ray diffraction measurements are consistent with this spectral change indicating a structural phase transition. For example, we find that the triplet at the pseudocubic [220] Bragg peak merges into a doublet above 6 GPa. The analyzed results indicate that the morphotropic phase boundary (x=0.33 to 0.37) with monoclinic symmetry persists up to 7 GPa. The pressure dependence of ferroelectric domains in PMN-0.32PT single crystals was observed with a polarizing optical microscope. The domain wall density decreases with pressure and the domains disappears at modest pressure of 3 GPa. This indicates that the high pressure phase of PMN-PT is not a macroscopic polar state. We suggest a phase diagram for the PMN-xPT solid solutions.
Keywords :
Raman spectra; electric domains; high-pressure solid-state phase transformations; lead compounds; optical microscopy; phase diagrams; relaxor ferroelectrics; solid solutions; PMN-0.32PT single crystals; PMN-PbTiO3; PMN-xPT solid solutions; Pb(Mg1/3Nb2/3)O3-PbTiO3 solid solutions; diamond anvil cells; domain wall density; ferroelectric domains; high-pressure Raman spectra; high-pressure X-ray diffraction; monoclinic symmetry; morphotropic phase boundary; optical microscopic methods; polarizing optical microscope; pressure 20 GPa; pressure-composition phase diagram; pseudocubic Bragg peak; structural phase transition; temperature 300 K; Lead; high pressure; phase diagram; relaxor ferroelectrics; x-ray diffraction;
Conference_Titel :
Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1162-6
Electronic_ISBN :
978-1-4577-1161-9
DOI :
10.1109/ISAF.2011.6014105