• DocumentCode
    32283
  • Title

    Reassessment of the Limiting Efficiency for Crystalline Silicon Solar Cells

  • Author

    Richter, A. ; Hermle, M. ; Glunz, S.W.

  • Author_Institution
    Fraunhofer Inst. for Solar Energy Syst., Freiburg, Germany
  • Volume
    3
  • Issue
    4
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    1184
  • Lastpage
    1191
  • Abstract
    Recently, several parameters relevant for modeling crystalline silicon solar cells were improved or revised, e.g., the international standard solar spectrum or properties of silicon such as the intrinsic recombination rate and the intrinsic carrier concentration. In this study, we analyzed the influence of these improved state-of-the-art parameters on the limiting efficiency for crystalline silicon solar cells under 1-sun illumination at 25°C, by following the narrow-base approximation to model ideal solar cells. We also considered bandgap narrowing, which was not addressed so far with respect to efficiency limitation. The new calculations that are presented in this study result in a maximum theoretical efficiency of 29.43% for a 110-μm-thick solar cell made of undoped silicon. A systematic calculation of the I-V parameters as a function of the doping concentration and the cell thickness together with an analysis of the loss current at maximum power point provides further insight into the intrinsic limitations of silicon solar cells.
  • Keywords
    doping profiles; electrical conductivity; elemental semiconductors; energy gap; semiconductor device models; silicon; solar cells; 1-sun illumination; I-V parameters; Si; bandgap narrowing; cell thickness; crystalline silicon solar cells; doping concentration; limiting efficiency reassessment; loss current; size 110 mum; temperature 25 degC; undoped silicon; Crystalline materials; Doping; Photovoltaic cells; Radiative recombination; Silicon; Efficiency limit; silicon; solar cells;
  • fLanguage
    English
  • Journal_Title
    Photovoltaics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    2156-3381
  • Type

    jour

  • DOI
    10.1109/JPHOTOV.2013.2270351
  • Filename
    6557081