Electrical resistance response evaluation of semiconducting single-walled carbon nanotube film for X-ray sensing

Author

Kang, Qingsheng ; Yeow, John T W

Author_Institution

Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada

fYear

2011

fDate

15-18 Aug. 2011

Firstpage

387

Lastpage

391

Abstract

The electrical resistance responses of a semiconducting single-walled carbon nanotube (SWCNT) film irradiated by 6MV and 15MV energy X-rays were evaluated. Results indicate that the dynamic responses exhibit fluctuations which may be an intrinsic feature of SWCNT networks due to the large number of interconnections between individual SWCNTs. The average resistance-dose rate relations of the SWCNT network are quasi-linear and can be used for dosimetry measurements in medical radiation applications.

Keywords

X-ray detection; X-ray effects; carbon nanotubes; electric resistance; elemental semiconductors; interconnections; nanosensors; nanotube devices; semiconductor nanotubes; C; X-ray sensing; average resistance-dose rate relations; dosimetry measurements; dynamic responses; electrical resistance response evaluation; interconnections; medical radiation applications; semiconducting single-walled carbon nanotube film; single-walled carbon nanotube networks; voltage 15 MV; voltage 6 MV; Carbon nanotubes; Electrical resistance measurement; Films; Fluctuations; Immune system; Resistance; Nanotube; X-ray; dosimeter; electrical resistance;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on

Conference_Location

Portland, OR

ISSN

1944-9399

Print_ISBN

978-1-4577-1514-3

Electronic_ISBN

1944-9399

Type

conf

DOI

10.1109/NANO.2011.6144504

Filename

6144504