• DocumentCode
    3228444
  • Title

    Evaluation of nanoknife´s edge angle for single cell cutting by using nanorobotic manipulators inside ESEM

  • Author

    Shen, Yajing ; Nakajimat, Masahiro ; Yang, Zhan ; Kojima, Seiji ; Homma, Mitsutaka ; Kojima, Masaru ; Fukuda, Toshio

  • Author_Institution
    Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
  • fYear
    2011
  • fDate
    15-18 Aug. 2011
  • Firstpage
    155
  • Lastpage
    160
  • Abstract
    Cell cutting is an important step in cell analysis processes. To address the single cell cutting at nano scale, Three types of nanoknives are designed in this paper. The first type of nanoknive was fabricated from a tungsten and the second type was fabricated from an atomic force microscopy(AFM)cantilever. In order to protect the nanoknife tip during the cell cutting, a novel nanoknife with a buffering beam is proposed. This kind of nanoknife was fabricated from a commercial AFM cantilever by focused ion beam (FIB) etching technique. The buffering beam can be also used to measure the cutting force based on its deformation. The spring constant of the beam was calibrated based on a referenced cantilever by using a nanomanipulation approach. The tip of the nanoknife was designed with a small edge angle 5° to reduce the compression to the cell during the cutting procedure. For comparison, two other nanoknives with different edge angles, i.e. 25° and 45°, were also prepared. An in-situ single cell cutting experiment was performed using these three nanoknives inside an environmental scanning electron microscope (ESEM). The cutting force and the sample slice angle for each nanoknife were evaluated. It showed the compression to the cell can be reduced when using the nanoknife with a small edge angle 5°. Consequently, the nanoknife was capable for in-situ single cell cutting tasks.
  • Keywords
    atomic force microscopy; cellular biophysics; focused ion beam technology; manipulators; medical robotics; nanobiotechnology; scanning electron microscopy; AFM cantilever; ESEM; atomic force microscopy; buffering beam; cell analysis; deformation; environmental scanning electron microscopy; focused ion beam; nanoknife edge angle; nanomanipulation; nanorobotic manipulator; single cell cutting; spring constant; Biomedical imaging; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
  • Conference_Location
    Portland, OR
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4577-1514-3
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2011.6144510
  • Filename
    6144510