Title :
Jitter generation and capture using phase-domain sigma-delta encoding
Author :
Aouini, Sadok ; Chuai, Kun ; Roberts, Gordon W.
Author_Institution :
Integrated Microsyst. Lab., McGill Univ., Montreal, QC, Canada
Abstract :
This article presents techniques and circuits for jitter generation and measurement. The proposed implementations use periodic bit-streams and high-order PLLs to generate the desired phase signal. Here, an arbitrary signal is first encoded using sigma-delta modulation in the digital amplitude-domain and converted to the phase-domain through a digital-to-time converter (DTC) process realized in software. The resulting bit-stream is inputted cyclically to a high-order phase-locked loop (PLL) behaving as a time-domain filter. The parameters of the sigma-delta modulator along with those of the high-order PLL can be traded for one another to achieve maximum performance. The method to generate the sigma-delta encoded phase signal and to design the high-order PLL is presented. A high quality Gaussian jitter signal has been experimentally generated. Also, a setup using DC encoded phase shifts serving as an under-sampling clock to measure jitter with a 50 GHz effective sampling rate has also been experimentally proven. The conciseness and digital nature of the jitter generation scheme together with the jitter measurement architecture makes them easily amenable to a design-for-test framework.
Keywords :
design for testability; encoding; jitter; phase locked loops; sigma-delta modulation; signal generators; time-domain analysis; DC encoded phase shifts; arbitrary signal; design-for-test framework; digital amplitude-domain; digital-to-time converter process; frequency 50 GHz; high quality Gaussian jitter signal; high-order PLL; high-order phase-locked loop; jitter generation; jitter measurement architecture; periodic bit-streams; phase-domain sigma-delta encoding; sigma-delta encoded phase signal; sigma-delta modulation; sigma-delta modulator; time-domain filter; under-sampling clock; Clocks; Encoding; Jitter; Noise; Phase locked loops; Sigma delta modulation; Time domain analysis; BIST; Jitter generation; PLL; design-for-test; jitter capture; time-encoding;
Conference_Titel :
Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-7454-7
DOI :
10.1109/APCCAS.2010.5774871