DocumentCode :
3228671
Title :
Dynamic range enhancement algorithms for CMOS sensors with non-destructive readout
Author :
Kachatkou, Anton ; Van Silfhout, Roelof
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester
fYear :
2008
fDate :
10-12 Sept. 2008
Firstpage :
132
Lastpage :
137
Abstract :
Image sensors capable of a non-destructive readout (NDR) allow reading several frames during the integration time without affecting a photo charge being collected in the pixelpsilas well. We show that two published algorithms for processing the sequence of NDR frames into a high dynamic range (HDR) image suffer from ldquostepped gradientrdquo artifacts using data taken with an ldquooff-the-shelfrdquo CMOS image sensor. We present a novel algorithm that is capable of alleviating this image artifact that is due to suboptimal saturated pixel treatment. Our procedure works for both black and white and color images. In addition, we present joint demosaicing and denoising for color HDR image reconstruction and its performance is compared with conventional demosaicing algorithms. The overall performance of the combined methods provides a DR increase of up to 44 dB compared to raw data. We demonstrate our algorithms using images taken with a black-and-white and color NDR capable camera system.
Keywords :
CMOS image sensors; cameras; image sequences; nondestructive readout; black-and-white NDR camera system; color NDR camera system; dynamic range enhancement algorithms; high dynamic range image; integration time; nondestructive readout; off-the-shelf CMOS image sensor; sequence processing; stepped gradient artifacts; CMOS image sensors; Color; Colored noise; Dynamic range; Heuristic algorithms; Image sensors; Pixel; Semiconductor device noise; Sensor systems; Signal to noise ratio; CMOS image sensor; demosaicing; dynamic range enhancement; embedded camera system; noise removal; non-destructive readout; saturated pixels extrapolation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Imaging Systems and Techniques, 2008. IST 2008. IEEE International Workshop on
Conference_Location :
Crete
Print_ISBN :
978-1-4244-2496-2
Electronic_ISBN :
978-1-4244-2497-9
Type :
conf
DOI :
10.1109/IST.2008.4659956
Filename :
4659956
Link To Document :
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