DocumentCode :
3228941
Title :
Upconversion and reduced 4F3/2 upper-state lifetimes in intensely pumped Nd:YLF
Author :
Zuegel, J.D. ; Seka, W.
Author_Institution :
Lab. for Laser Energetics, Rochester Univ., NY, USA
Volume :
2
fYear :
1995
fDate :
30 Oct-2 Nov 1995
Firstpage :
204
Abstract :
Summary form only given. Intense diode-pumping of Nd-doped active elements in Q-switched lasers is a common approach to improve system efficiency, reliability, and reducing size. Compact laser devices using highly doped active elements with short pump absorption depths are particularly attractive for high average power applications since the thermal loads are more easily dissipated from the small-volume active elements. The 4F3/2 upper-state lifetime, τ, is an important parameter for engineering such lasers since it affects the achievable stored-energy density for a given pumping scheme and ultimately determines the output energy of the system. Energy transfer upconversion (ETU) and sequential two-photon excitation processes (STEP) have been identified as important upconversion mechanisms. The same upconversion processes observed to reduce 1 μm upper laser lifetime in Nd:YLF may also offer the potential for diode-pumped visible and near-UV laser sources in this material
Keywords :
fluorescence; laser reliability; lithium compounds; neodymium; optical pumping; optical saturable absorption; solid lasers; ultraviolet spectra; visible spectra; μm upper laser lifetime; 4F3/2 upper-state lifetime; LiYF4:Nd; Nd-doped active elements; Nd:YLF; Q-switched lasers; energy transfer upconversion; high average power applications; intense diode-pumping; intensely pumped Nd:YLF; pumping scheme; reduced 4F3/2 upper-state lifetimes; reliability; sequential two-photon excitation processes; short pump absorption depths; small-volume active elements; stored-energy density; system efficiency; thermal loads; upconversion mechanisms; Absorption; Diodes; Energy exchange; Laser excitation; Optical materials; Power engineering and energy; Power lasers; Power system reliability; Pump lasers; Thermal loading;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2450-1
Type :
conf
DOI :
10.1109/LEOS.1995.484666
Filename :
484666
Link To Document :
بازگشت