DocumentCode :
3229032
Title :
Decomposition based approach for synthesis of multi-level threshold logic circuits
Author :
Gowda, Tejaswi ; Vrudhula, Sarma
Author_Institution :
Arizona State Univ., Tempe
fYear :
2008
fDate :
21-24 March 2008
Firstpage :
125
Lastpage :
130
Abstract :
Scaling is currently the most popular technique used to improve performance metrics of CMOS circuits. This cannot go on forever because the properties that are responsible for the functioning of MOSFETs no longer hold in nano dimensions. Recent research into nano devices has shown that nano devices can be an alternative to CMOS when scaling of CMOS becomes infeasible in the near future. This is motivating the need for stable and mature design automation techniques for threshold logic since it is the design abstraction used for most nano- devices. This paper presents a new decomposition theory that is based on the properties of threshold functions. The main contributions of this paper are: (1) A new method of algebraic factorization called the min-max factorization. (2) A decomposition theory that uses this new factorization to identify and characterize threshold functions. (3) A new threshold logic synthesis methodology that uses the decomposition theory. This synthesis methodology produces circuits that are better than the previous state of art (27% better gate count and comparable circuit depth).
Keywords :
CMOS integrated circuits; MOSFET; integrated circuit design; logic circuits; logic design; minimax techniques; nanoelectronics; threshold logic; CMOS circuits; MOSFET; decomposition based approach; design automation techniques; minmax factorization; multilevel threshold logic circuits; nano devices; threshold logic synthesis methodology; CMOS logic circuits; Circuit synthesis; Design automation; Logic circuits; Logic design; Logic devices; Logic functions; MOSFETs; Measurement; Nanoscale devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1921-0
Electronic_ISBN :
978-1-4244-1922-7
Type :
conf
DOI :
10.1109/ASPDAC.2008.4483925
Filename :
4483925
Link To Document :
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