Title :
Evaluating the risk of equipment disruption related to voltage sags
Author :
Kagan, N. ; Matsuo, N.M. ; Vasconcelos, G. ; Castellano, U.E. ; Cebrian, J.C. ; Camilo, L.M. ; Duarte, S.X. ; Arango, H. ; Bernartelli, W.H. ; Marsulo, J.A.
Author_Institution :
Dept. of Electr. Eng., Sao Paulo Univ., Brazil
Abstract :
This paper presents a methodology for risk analysis applied to voltage sags in distribution networks. The basis of the methodology is presented, as well as the description of its implementation. Two evaluations are performed for a given distribution network: frequency of occurrence of voltage sags and the impact of the voltage sags on customer loads in statistical basis. Fault events are simulated using the Monte Carlo method, in which variables related to faults are determined according to their probability distributions. The magnitude and the duration of voltage sags and occurrence of interruptions are determined in the network points by considering the fault conditions and the line overcurrent protection devices characteristics. The results presented are indices of sag events and equipment breakdown for any desired voltage tolerance curves, which allows mapping the network in respect to risk, associated to sag events. The emphasis of the studies lies upon the practical questions that appear when industries already installed or planning installation are faced with decisions which are influenced by the rate of occurrence of voltage sags.
Keywords :
Monte Carlo methods; electric breakdown; fault location; overcurrent protection; power distribution faults; power distribution planning; power distribution protection; power supply quality; risk analysis; statistical distributions; Monte Carlo method; customer load; distribution network; equipment breakdown; equipment disruption; fault condition; fault event; interruption occurrence; line overcurrent protection devices characteristic; network point; planning installation; power quality; probability distribution; risk analysis; statistical basis; stochastic method; voltage sag; voltage tolerance curve; Breakdown voltage; Circuit faults; Industrial economics; Manufacturing industries; Power quality; Probability distribution; Production; Protection; Risk analysis; Voltage fluctuations;
Conference_Titel :
Transmission and Distribution Conference and Exposition: Latin America, 2004 IEEE/PES
Print_ISBN :
0-7803-8775-9
DOI :
10.1109/TDC.2004.1432459