Title :
Influence of interface effect on the ferroelectric and ferromagnetic properties of CFO/PMNT multilayered thin films
Author :
Zhu, Jianguo ; Chen, Xiaolong ; Guo, Hongli ; Yan, Dongxu ; Liu, Hong ; Xiao, Dingquan
Author_Institution :
Coll. of Mater. Sci. & Eng., Sichuan Univ., Chengdu, China
Abstract :
The CoFe2O4/Pb(Mg1/3Nb2/3)O3-PbTiO3 (CFO/PMNT) multilayer thin films have been prepared on LaNiO3/SiO2/Si(100) substrate using radio frequency magnetron sputtering method. The smooth, dense and crack-free surface of CFO/PMNT multilayer thin film shows the excellent crystal quality with root-mean-square (RMS) roughness only 2.9nm. The influence of the interface effect, film thickness, period number n and crystallite orientation of CFO/PMNT multilayer thin films on their ferroelectric and ferromagnetic properties were investigated. The related mechanism was also discussed.
Keywords :
cobalt compounds; crystallites; ferrites; ferroelectric thin films; ferroelectricity; ferromagnetic materials; lead compounds; magnetic multilayers; magnetic thin films; sputter deposition; surface roughness; CoFe2O4-Pb(Mg0.33Nb0.67)O3-PbTiO3; LaNiO3-SiO2-Si; LaNiO3/SiO2/Si(100) substrate; crack-free surface smoothness; crystal quality; crystallite orientation; ferroelectric properties; ferromagnetic properties; interface effect; multilayered thin films; radio frequency magnetron sputtering; root-mean-square roughness; Magnetic films; Magnetic hysteresis; Magnetic multilayers; Magnetic properties; Magnetoelectric effects; Magnetomechanical effects; CFO/PMNT; interface effect; multilayer thin films;
Conference_Titel :
Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1162-6
Electronic_ISBN :
978-1-4577-1161-9
DOI :
10.1109/ISAF.2011.6014155
