DocumentCode :
3229562
Title :
The dependence of fingerprints relevant to PDs on degradation time and test voltage
Author :
Bozzo, R. ; Gemme, C. ; Guastavino, F.
Author_Institution :
Dipt. di Ingegneria Elettrica, Genoa Univ., Italy
Volume :
2
fYear :
1996
fDate :
20-23 Oct 1996
Firstpage :
500
Abstract :
Partial Discharge (PD) digital measurement systems allow one to obtain derived quantities (fingerprints) which can be related to the morphology of the discharge site and to its degradation level. Nevertheless fingerprint values can change depending on several parameters characterising the experiments. In this paper, the results of PD tests evidence the dependence of some of the fingerprints, relevant to treeing tests and surface PD tests, on the degradation time and on the applied voltage. As such a dependence is different for different kinds of discharge sites, it is proposed to consider the dependence on degradation time or on the applied voltage as a complementary information useful to perform the diagnostic of insulation systems
Keywords :
insulation testing; partial discharges; surface discharges; trees (electrical); PDs; degradation time; derived quantities; discharge site; fingerprints; insulation system diagnostics; surface PD tests; test voltage; treeing tests; Degradation; Fingerprint recognition; Insulation; Partial discharge measurement; Partial discharges; Performance evaluation; Surface discharges; Surface morphology; System testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location :
Millbrae, CA
Print_ISBN :
0-7803-3580-5
Type :
conf
DOI :
10.1109/CEIDP.1996.564519
Filename :
564519
Link To Document :
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