• DocumentCode
    3229567
  • Title

    Optical memory using an atomic force microscope and a surface micromachined interferometer

  • Author

    Christenson, G.L. ; Miller, S.A. ; Tran, A.T.T.D. ; Haronian, D. ; Lo, Y.H. ; MacDonald, N.C.

  • Author_Institution
    Cornell Univ., Ithaca, NY, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    30 Oct-2 Nov 1995
  • Firstpage
    262
  • Abstract
    Summary form only given. We demonstrate an optical reading technique which uses an atomic force microscope (AFM) and a micromechanically released membrane. Memory optical storage methods involving the AFM or the scanning tunneling microscope (STM) are desirable for their potential applications in extremely high density memory data bit arrays. The densities of bits written using scanning probe microscope tips are more than two orders of magnitude greater than that available with state-of-the-art commercial optical techniques
  • Keywords
    light interferometers; micromachining; micromechanical devices; optical storage; scanning tunnelling microscopy; AFM; STM; atomic force microscope; extremely high density memory data bit arrays; memory optical storage methods; micromechanically released membrane; optical memory; optical reading technique; scanning tunneling microscope; surface micromachined interferometer; written bit density; Apertures; Atom optics; Atomic force microscopy; Biomembranes; Interference; Mirrors; Optical interferometry; Optical microscopy; Optical sensors; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2450-1
  • Type

    conf

  • DOI
    10.1109/LEOS.1995.484694
  • Filename
    484694