DocumentCode
3229567
Title
Optical memory using an atomic force microscope and a surface micromachined interferometer
Author
Christenson, G.L. ; Miller, S.A. ; Tran, A.T.T.D. ; Haronian, D. ; Lo, Y.H. ; MacDonald, N.C.
Author_Institution
Cornell Univ., Ithaca, NY, USA
Volume
2
fYear
1995
fDate
30 Oct-2 Nov 1995
Firstpage
262
Abstract
Summary form only given. We demonstrate an optical reading technique which uses an atomic force microscope (AFM) and a micromechanically released membrane. Memory optical storage methods involving the AFM or the scanning tunneling microscope (STM) are desirable for their potential applications in extremely high density memory data bit arrays. The densities of bits written using scanning probe microscope tips are more than two orders of magnitude greater than that available with state-of-the-art commercial optical techniques
Keywords
light interferometers; micromachining; micromechanical devices; optical storage; scanning tunnelling microscopy; AFM; STM; atomic force microscope; extremely high density memory data bit arrays; memory optical storage methods; micromechanically released membrane; optical memory; optical reading technique; scanning tunneling microscope; surface micromachined interferometer; written bit density; Apertures; Atom optics; Atomic force microscopy; Biomembranes; Interference; Mirrors; Optical interferometry; Optical microscopy; Optical sensors; Scanning electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-2450-1
Type
conf
DOI
10.1109/LEOS.1995.484694
Filename
484694
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