Title :
Optical memory using an atomic force microscope and a surface micromachined interferometer
Author :
Christenson, G.L. ; Miller, S.A. ; Tran, A.T.T.D. ; Haronian, D. ; Lo, Y.H. ; MacDonald, N.C.
Author_Institution :
Cornell Univ., Ithaca, NY, USA
fDate :
30 Oct-2 Nov 1995
Abstract :
Summary form only given. We demonstrate an optical reading technique which uses an atomic force microscope (AFM) and a micromechanically released membrane. Memory optical storage methods involving the AFM or the scanning tunneling microscope (STM) are desirable for their potential applications in extremely high density memory data bit arrays. The densities of bits written using scanning probe microscope tips are more than two orders of magnitude greater than that available with state-of-the-art commercial optical techniques
Keywords :
light interferometers; micromachining; micromechanical devices; optical storage; scanning tunnelling microscopy; AFM; STM; atomic force microscope; extremely high density memory data bit arrays; memory optical storage methods; micromechanically released membrane; optical memory; optical reading technique; scanning tunneling microscope; surface micromachined interferometer; written bit density; Apertures; Atom optics; Atomic force microscopy; Biomembranes; Interference; Mirrors; Optical interferometry; Optical microscopy; Optical sensors; Scanning electron microscopy;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2450-1
DOI :
10.1109/LEOS.1995.484694