• DocumentCode
    3229837
  • Title

    Evaluation of Thin Film Coating Adhesion with an Opto-Acoustic Technique

  • Author

    Flowers, Patrick F. ; Yoshida, Sanichiro ; Gomi, Kenji ; Adhikari, Sushovit ; Dreux, Katelyn ; Basnet, Mohan ; Miyasaka, Chiaki ; Tittmann, Bernhard R. ; Park, Ik-Keun

  • Author_Institution
    Dept. of Chem. & Phys., Southeastern Louisiana Univ., Hammond, LA, USA
  • fYear
    2011
  • fDate
    18-21 Oct. 2011
  • Firstpage
    1103
  • Lastpage
    1106
  • Abstract
    An opto-acoustic technique to evaluate the adhesion strength at the interface of nano-scale thin film systems has been demonstrated. The specimens have been integrated into a Michelson interferometer as the end mirrors, and driven from the rear with an acoustic transducer at moderate frequencies. The resultant film surface displacement has been detected as a fringe shift of the interference intensity pattern behind the beam splitter with a digital imaging device at a normal frame rate. Comparison has been made between strongly and weakly adhered film specimens. The difference in the adhesion strength has been successfully visualized as the difference in the fringe contrast. Fourier analysis on the fringe pattern has quantified the fringe contrast.
  • Keywords
    Fourier analysis; Michelson interferometers; acoustic transducers; adhesion; coatings; nanostructured materials; photoacoustic effect; thin films; Fourier analysis; Michelson interferometer; Si; acoustic transducer; adhesion strength; digital imaging device; fringe contrast; fringe shift; interference intensity pattern; nanoscale thin film systems; optoacoustic technique; resultant film surface displacement; thin film coating; Acoustics; Adhesives; Films; Optical interferometry; Optical surface waves; Substrates; Surface treatment; Acoustic measurements; Nondestructive testing; Optical interferometry; Thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2011 IEEE International
  • Conference_Location
    Orlando, FL
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4577-1253-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2011.0271
  • Filename
    6293406