DocumentCode :
3229837
Title :
Evaluation of Thin Film Coating Adhesion with an Opto-Acoustic Technique
Author :
Flowers, Patrick F. ; Yoshida, Sanichiro ; Gomi, Kenji ; Adhikari, Sushovit ; Dreux, Katelyn ; Basnet, Mohan ; Miyasaka, Chiaki ; Tittmann, Bernhard R. ; Park, Ik-Keun
Author_Institution :
Dept. of Chem. & Phys., Southeastern Louisiana Univ., Hammond, LA, USA
fYear :
2011
fDate :
18-21 Oct. 2011
Firstpage :
1103
Lastpage :
1106
Abstract :
An opto-acoustic technique to evaluate the adhesion strength at the interface of nano-scale thin film systems has been demonstrated. The specimens have been integrated into a Michelson interferometer as the end mirrors, and driven from the rear with an acoustic transducer at moderate frequencies. The resultant film surface displacement has been detected as a fringe shift of the interference intensity pattern behind the beam splitter with a digital imaging device at a normal frame rate. Comparison has been made between strongly and weakly adhered film specimens. The difference in the adhesion strength has been successfully visualized as the difference in the fringe contrast. Fourier analysis on the fringe pattern has quantified the fringe contrast.
Keywords :
Fourier analysis; Michelson interferometers; acoustic transducers; adhesion; coatings; nanostructured materials; photoacoustic effect; thin films; Fourier analysis; Michelson interferometer; Si; acoustic transducer; adhesion strength; digital imaging device; fringe contrast; fringe shift; interference intensity pattern; nanoscale thin film systems; optoacoustic technique; resultant film surface displacement; thin film coating; Acoustics; Adhesives; Films; Optical interferometry; Optical surface waves; Substrates; Surface treatment; Acoustic measurements; Nondestructive testing; Optical interferometry; Thin films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium (IUS), 2011 IEEE International
Conference_Location :
Orlando, FL
ISSN :
1948-5719
Print_ISBN :
978-1-4577-1253-1
Type :
conf
DOI :
10.1109/ULTSYM.2011.0271
Filename :
6293406
Link To Document :
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