Title :
Synthesis of four new members of the (PbSe)1.16(TiSe2)n (n = 1, 2, 3, and 4) Family of ferecrystals
Author :
Moore, Daniel B. ; Beekman, Matt ; Zschack, Paul ; Johnson, David C.
Author_Institution :
Dept. of Chem., Univ. of Oregon, Eugene, OR, USA
Abstract :
A new family of turbostratically disordered misfit layered compounds (ferecrystals), (PbSe)1.16(TiSe2)n, is described with n values of 1, 2, 3 and 4. These compounds were synthesized using the modulated elemental reactant method (MER). The high-resolution transmission electron micrographs of these compounds clearly show rotational disorder in the constituent layers of these compounds. θ - 2θ x-ray diffraction scans contain many 00l superlattice diffraction peaks. The c axis lattice parameters determined from this data show a systematic increase as n, the number of TiSe2 layer, is increased.
Keywords :
IV-VI semiconductors; X-ray diffraction; lead compounds; semiconductor growth; semiconductor superlattices; titanium compounds; transmission electron microscopy; (PbSe)1.16(TiSe2)n; c axis lattice parameters; ferecrystals; high-resolution transmission electron micrographs; modulated elemental reactant; superlattice diffraction peaks; turbostratically disordered misfit layered compounds; x-ray diffraction; Annealing; Compounds; Diffraction; Lattices; Lead; Reflection; X-ray diffraction; Ferecrystals; misfit layered compounds; synthesis;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
DOI :
10.1109/NANO.2011.6144586
