DocumentCode
3229954
Title
Analysis of partial discharges in a capacitor-type structure
Author
Gosse, B. ; Hammal, R. ; Sassoulas, P.O. ; Gosse, J.-P.
Author_Institution
Univ. Joseph Fourier, Grenoble, France
Volume
2
fYear
1996
fDate
20-23 Oct 1996
Firstpage
510
Abstract
Partial discharges in a capacitor-type structure have been registered with a digital discharge analyzer for increasing voltages up to breakdown. The capacitor contained two 13.6 μm thick PP films pressed between two plane electrodes. The discharges were located by FTIR mapping at the edge of the electrodes. At high applied voltages, electrochemiluminescence and discharges give light emission, the first phenomenon being predominant. The variations with time of the light emitted by the discharges have been correlated with the phase-distributions of their number and charge
Keywords
capacitors; chemiluminescence; electroluminescence; partial discharges; polymer films; FTIR mapping; PP film; breakdown; capacitor; digital discharge analyzer; electrochemiluminescence; light emission; partial discharge; phase distribution; plane electrode; Breakdown voltage; Capacitors; Degradation; Electrodes; Fault location; Frequency; Optical films; Partial discharges; Photomultipliers; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location
Millbrae, CA
Print_ISBN
0-7803-3580-5
Type
conf
DOI
10.1109/CEIDP.1996.564521
Filename
564521
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