• DocumentCode
    3229954
  • Title

    Analysis of partial discharges in a capacitor-type structure

  • Author

    Gosse, B. ; Hammal, R. ; Sassoulas, P.O. ; Gosse, J.-P.

  • Author_Institution
    Univ. Joseph Fourier, Grenoble, France
  • Volume
    2
  • fYear
    1996
  • fDate
    20-23 Oct 1996
  • Firstpage
    510
  • Abstract
    Partial discharges in a capacitor-type structure have been registered with a digital discharge analyzer for increasing voltages up to breakdown. The capacitor contained two 13.6 μm thick PP films pressed between two plane electrodes. The discharges were located by FTIR mapping at the edge of the electrodes. At high applied voltages, electrochemiluminescence and discharges give light emission, the first phenomenon being predominant. The variations with time of the light emitted by the discharges have been correlated with the phase-distributions of their number and charge
  • Keywords
    capacitors; chemiluminescence; electroluminescence; partial discharges; polymer films; FTIR mapping; PP film; breakdown; capacitor; digital discharge analyzer; electrochemiluminescence; light emission; partial discharge; phase distribution; plane electrode; Breakdown voltage; Capacitors; Degradation; Electrodes; Fault location; Frequency; Optical films; Partial discharges; Photomultipliers; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
  • Conference_Location
    Millbrae, CA
  • Print_ISBN
    0-7803-3580-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.1996.564521
  • Filename
    564521