Title :
Faster projection based methods for circuit level verification
Author :
Yan, Chao ; Greenstreet, Mark
Author_Institution :
Univ. of British Columbia, Vancouver
Abstract :
As VLSI fabrication technology progresses to 65 nm feature sizes and smaller, transistors no longer operate as ideal switches. This motivates the verification of digital circuits using continuous models. Recently, we showed how such verification can be performed using projection based methods.However, the verification was slow, requiring nearly four CPU days to verify a nine-transistor toggle flip-flop. Here, we describe improvements to the reachability algorithms and optimizations of the software architecture. These produce a 15 x reduction in computation time and significant reductions in the overapproximation errors. With these changes, the same toggle flip-flop can be verified in a few hours, making formal verification a viable alternative to circuit simulation.
Keywords :
VLSI; formal verification; software architecture; VLSI fabrication technology; circuit level verification; faster projection based methods; formal verification; reachability algorithms; software architecture; Central Processing Unit; Circuit simulation; Digital circuits; Fabrication; Flip-flops; Formal verification; Software algorithms; Software architecture; Switches; Very large scale integration;
Conference_Titel :
Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1921-0
Electronic_ISBN :
978-1-4244-1922-7
DOI :
10.1109/ASPDAC.2008.4483985