DocumentCode
3230195
Title
Faster projection based methods for circuit level verification
Author
Yan, Chao ; Greenstreet, Mark
Author_Institution
Univ. of British Columbia, Vancouver
fYear
2008
fDate
21-24 March 2008
Firstpage
410
Lastpage
415
Abstract
As VLSI fabrication technology progresses to 65 nm feature sizes and smaller, transistors no longer operate as ideal switches. This motivates the verification of digital circuits using continuous models. Recently, we showed how such verification can be performed using projection based methods.However, the verification was slow, requiring nearly four CPU days to verify a nine-transistor toggle flip-flop. Here, we describe improvements to the reachability algorithms and optimizations of the software architecture. These produce a 15 x reduction in computation time and significant reductions in the overapproximation errors. With these changes, the same toggle flip-flop can be verified in a few hours, making formal verification a viable alternative to circuit simulation.
Keywords
VLSI; formal verification; software architecture; VLSI fabrication technology; circuit level verification; faster projection based methods; formal verification; reachability algorithms; software architecture; Central Processing Unit; Circuit simulation; Digital circuits; Fabrication; Flip-flops; Formal verification; Software algorithms; Software architecture; Switches; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
Conference_Location
Seoul
Print_ISBN
978-1-4244-1921-0
Electronic_ISBN
978-1-4244-1922-7
Type
conf
DOI
10.1109/ASPDAC.2008.4483985
Filename
4483985
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