• DocumentCode
    3230195
  • Title

    Faster projection based methods for circuit level verification

  • Author

    Yan, Chao ; Greenstreet, Mark

  • Author_Institution
    Univ. of British Columbia, Vancouver
  • fYear
    2008
  • fDate
    21-24 March 2008
  • Firstpage
    410
  • Lastpage
    415
  • Abstract
    As VLSI fabrication technology progresses to 65 nm feature sizes and smaller, transistors no longer operate as ideal switches. This motivates the verification of digital circuits using continuous models. Recently, we showed how such verification can be performed using projection based methods.However, the verification was slow, requiring nearly four CPU days to verify a nine-transistor toggle flip-flop. Here, we describe improvements to the reachability algorithms and optimizations of the software architecture. These produce a 15 x reduction in computation time and significant reductions in the overapproximation errors. With these changes, the same toggle flip-flop can be verified in a few hours, making formal verification a viable alternative to circuit simulation.
  • Keywords
    VLSI; formal verification; software architecture; VLSI fabrication technology; circuit level verification; faster projection based methods; formal verification; reachability algorithms; software architecture; Central Processing Unit; Circuit simulation; Digital circuits; Fabrication; Flip-flops; Formal verification; Software algorithms; Software architecture; Switches; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-1921-0
  • Electronic_ISBN
    978-1-4244-1922-7
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2008.4483985
  • Filename
    4483985