Title :
Experimental exploration of imaging properties of a two-dimensional flat lens made of phononic crystals
Author :
Manga, Etoungh Dimitri ; Haumesser, Lionel ; Morvan, Bruno ; Clézio, Emmanuel Le ; Hladky-Hennion, Anne-Christine
Author_Institution :
Lab. Imagerie et Cerveau, Univ. Francois Rabelais de Tours, Blois, France
Abstract :
We investigate negative refraction of acoustic waves in a two-dimensional phononic crystal (PC) made of stainless steel rods arranged in a triangular lattice filled with methanol. The theoretical dispersion curves of this PC exhibit a branch with group and phase velocities with opposite signs yielding to negative refraction. Moreover, in the frequency range of interest, the equi-frequency contours are circular around the high symmetry point T leading to a negative effective refractive index (ERI) constant at a given frequency whatever the incident angle. An experimental study is performed in a way to evaluate the ultrasonic beam deviation when the wave is transmitted through a slab of PC. This allows the determination of the experimental ERI as a function of the frequency. Furthermore, the transmission coefficients are obtained versus the incident angles. Finally, the property of All-Angle-Negative-Refraction (AANR) of the required PC for imaging is discussed.
Keywords :
lenses; phononic crystals; refractive index; stainless steel; ultrasonic dispersion; ultrasonic imaging; ultrasonic refraction; ultrasonic transmission; ultrasonic velocity; AANR; ERI constant; acoustic waves; all-angle-negative-refraction; dispersion curves; equifrequency contours; group velocities; high symmetry point; imaging properties; incident angle; methanol; negative effective refractive index; phase velocities; stainless steel rods; transmission coefficients; triangular lattice; two-dimensional PC; two-dimensional flat lens; two-dimensional phononic crystal; ultrasonic beam deviation; Acoustics; Effective refractive index; Negative refraction; Phononic crystals;
Conference_Titel :
Ultrasonics Symposium (IUS), 2011 IEEE International
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1253-1
DOI :
10.1109/ULTSYM.2011.0619