Title :
Measurement and simulation of discharge induced ageing processes in voids
Author :
Morshuis, Peter ; Niemeyer, Lutz
Author_Institution :
High Voltage Lab., Delft Univ. of Technol., Netherlands
Abstract :
Discharge induced ageing processes in dielectric voids can be evaluated by either phase-resolved or time-resolved partial discharge (PD) measurements. In this paper the relevant discharge mechanisms are discussed with particular emphasis on the Townsend mechanism. Experimental results are shown and compared with simulations based on physical models
Keywords :
Townsend discharge; ageing; charge measurement; insulation testing; partial discharges; polyethylene insulation; simulation; voids (solid); Townsend mechanism; dielectric voids; discharge induced ageing processes; discharge mechanisms; phase-resolved partial discharge measurements; physical models; polyethylene; simulations; time-resolved partial discharge measurements; voids; Aging; Dielectric measurements; Dielectrics and electrical insulation; Electrons; Feedback; Ionization; Partial discharge measurement; Partial discharges; Solids; Surface discharges;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location :
Millbrae, CA
Print_ISBN :
0-7803-3580-5
DOI :
10.1109/CEIDP.1996.564524
