Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device

Author

Verspecht, Jan ; Debie, P. ; Barel, A. ; Martens, Luc

Author_Institution

Network Meas. & Description Group, Hewlett-Packard Co., Brussels, Belgium

fYear

1995

fDate

16-20 May 1995

Firstpage

1029

Abstract

A measurement setup and calibration procedure are described allowing the accurate on wafer measurement of phases and amplitudes of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device. A comparison is made between measurements performed with the setup and simulations based on a Root-model.<>

Keywords

calibration; microwave circuits; microwave measurement; network analysers; nonlinear network analysis; phase measurement; two-port networks; Root-model; amplitude measurement; calibration procedure; incident voltage waves; measurement setup; microwave circuits; network analysers; nonlinear microwave device; on wafer measurement; phase measurement; scattered voltage waves; signal ports; spectral components; two-port devices; Calibration; Circuit simulation; Microwave devices; Microwave measurements; Performance evaluation; Phase measurement; Power generation; Scattering; Semiconductor device modeling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1995., IEEE MTT-S International

Conference_Location

Orlando, FL, USA

ISSN

0149-645X

Print_ISBN

0-7803-2581-8

Type

conf

DOI

10.1109/MWSYM.1995.406147

Filename

406147