Title :
Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device
Author :
Verspecht, Jan ; Debie, P. ; Barel, A. ; Martens, Luc
Author_Institution :
Network Meas. & Description Group, Hewlett-Packard Co., Brussels, Belgium
Abstract :
A measurement setup and calibration procedure are described allowing the accurate on wafer measurement of phases and amplitudes of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device. A comparison is made between measurements performed with the setup and simulations based on a Root-model.<>
Keywords :
calibration; microwave circuits; microwave measurement; network analysers; nonlinear network analysis; phase measurement; two-port networks; Root-model; amplitude measurement; calibration procedure; incident voltage waves; measurement setup; microwave circuits; network analysers; nonlinear microwave device; on wafer measurement; phase measurement; scattered voltage waves; signal ports; spectral components; two-port devices; Calibration; Circuit simulation; Microwave devices; Microwave measurements; Performance evaluation; Phase measurement; Power generation; Scattering; Semiconductor device modeling; Voltage;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406147
