• DocumentCode
    3230719
  • Title

    An industrial perspective of power-aware reliable SoC design

  • Author

    Eo, Soo-Kwan ; Yoo, Sungjoo ; Choi, Kyu-Myung

  • Author_Institution
    Samsung Electron., Yongin
  • fYear
    2008
  • fDate
    21-24 March 2008
  • Firstpage
    555
  • Lastpage
    557
  • Abstract
    Reliable SoC design is becoming one of important real design problems since the fast pace of semiconductor scaling and the introduction of new device structures and materials incur more reliability problems than can be solved in the given time frame (2 years/technology node). Reliable design mostly requires resource overhead (additional power consumption, silicon area, and execution time) to recover from errors. Minimizing the overhead in the reliable SoC design will give SoC industries a competitive edge. Especially, in the case of mobile SoC, mastering the overhead of power consumption is absolutely imperative. In this paper, we investigate reliable SoC design in terms of reducing the overhead of power consumption. First, we review the current practice of reliable SoC design and assess its impact on power consumption. Then, we present our perspective on new design methodology towards power-aware reliable SoC design.
  • Keywords
    logic design; system-on-chip; mobile SoC; power consumption; power-aware reliable SoC design; Chip scale packaging; Design methodology; Energy consumption; Error correction codes; Industrial electronics; Materials reliability; Random access memory; Redundancy; Semiconductor device reliability; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-1921-0
  • Electronic_ISBN
    978-1-4244-1922-7
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2008.4484012
  • Filename
    4484012