Title :
An industrial perspective of power-aware reliable SoC design
Author :
Eo, Soo-Kwan ; Yoo, Sungjoo ; Choi, Kyu-Myung
Author_Institution :
Samsung Electron., Yongin
Abstract :
Reliable SoC design is becoming one of important real design problems since the fast pace of semiconductor scaling and the introduction of new device structures and materials incur more reliability problems than can be solved in the given time frame (2 years/technology node). Reliable design mostly requires resource overhead (additional power consumption, silicon area, and execution time) to recover from errors. Minimizing the overhead in the reliable SoC design will give SoC industries a competitive edge. Especially, in the case of mobile SoC, mastering the overhead of power consumption is absolutely imperative. In this paper, we investigate reliable SoC design in terms of reducing the overhead of power consumption. First, we review the current practice of reliable SoC design and assess its impact on power consumption. Then, we present our perspective on new design methodology towards power-aware reliable SoC design.
Keywords :
logic design; system-on-chip; mobile SoC; power consumption; power-aware reliable SoC design; Chip scale packaging; Design methodology; Energy consumption; Error correction codes; Industrial electronics; Materials reliability; Random access memory; Redundancy; Semiconductor device reliability; Single event upset;
Conference_Titel :
Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1921-0
Electronic_ISBN :
978-1-4244-1922-7
DOI :
10.1109/ASPDAC.2008.4484012