• DocumentCode
    3230822
  • Title

    Comparison of power and performance for the TFET and MOSFET and considerations for P-TFET

  • Author

    Avci, Uygar E. ; Rios, Rafael ; Kuhn, Kelin J. ; Young, Ian A.

  • Author_Institution
    Technol. & Manuf. Group, Intel Corp., Hillsboro, OR, USA
  • fYear
    2011
  • fDate
    15-18 Aug. 2011
  • Firstpage
    869
  • Lastpage
    872
  • Abstract
    A detailed circuit assessment of Tunneling Field Effect Transistors (TFET) versus MOSFET transistors operating at a supply voltage near device threshold is reported, including the consideration of P-TFET device design. 20nm gate-length InAs TFET and Si MOSFET device characteristics are simulated and used in circuit simulations. For ultra low power logic applications, TFET logic can operate at equal standby power and switching energy to MOSFET logic, but with better performance. The study shows that the P-TFET device has a lower ION/IOFF ratio than the N-TFET due to the low conduction-band density of states (DOS) in III-V materials. It is shown that for a specific TFET power-performance target, the source doping level needs to be optimized.
  • Keywords
    MOSFET; field effect transistors; logic circuits; low-power electronics; tunnel transistors; MOSFET; TFET logic; low conduction-band density of states; tunneling field effect transistors; ultra low power logic applications; Doping; Integrated circuit modeling; Performance evaluation; Power MOSFET; Switches; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
  • Conference_Location
    Portland, OR
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4577-1514-3
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2011.6144631
  • Filename
    6144631